Single fault detection test sets with respect to stuck-at faults at the outputs of gates in formulas over some bases

The article establishes the exact values of the Shannon function of the cardinality of a single fault detection test set with respect to stuck-at faults at outputs of gates in formulas over the bases $\{xy,\,x\oplus y,\,1\}$, $\{x\vee y,\,x\sim y,\,0\}$, $\{xy,\,x\sim y,\,0\}$, $\{x\vee y,\,x\oplus y,\,1\}$, $\{x{\bar y},\,x\sim y\}$, $\{x\vee{\bar y},\,x\oplus y\}$.

УДК 519.718.7

 
Keywords: single fault detection test set, stuck-at faults, Boolean circuit, Boolean formula.