- Siberian Journal of Physics
- Archive
- 2008
- Vol 3. No 1
- Solid-State and Semiconductor Physics, Physics of Nanostructures
Kinetic phase contrast in atomic force microscopy
Dmitriy V. Sheglov
1. Rzhanov Institute of Semiconductor Physics SB RAS Novosibirsk, Russian Federation
2. Novosibirsk State University Novosibirsk, Russian Federation
sheglov@thermo.isp.nsc.ru
Aleksandr V. Latyshev
1. Novosibirsk State University Novosibirsk, Russian Federation
2. Rzhanov Institute of Semiconductor Physics SB RAS Novosibirsk, Russian Federation
latyshev@isp.nsc.ru
V. Yu. Popkov
1. Rzhanov Institute of Semiconductor Physics SB RAS Novosibirsk, Russian Federation
2. Novosibirsk State University Novosibirsk, Russian Federation
The material was received by the Editorial Board: 24.12.2007
УДК 53.083.98Kinetic phase contrast in atomic force microscopy
References: Shcheglov D. V., Latyshev A. V., Popkov V. Yu. Kinetic phase contrast in atomic force microscopy. Vestnik NSU. Series: Physics. 2008, vol. 3, no. 1. P. 91–99 (in Russ.). DOI: 10.54362/1818-7919-2008-3-1-91-99