6. GENERATION OF TERAHERTZ RADIATION

DESIGN STUDY OF A TABLE-TOP THZ FREE-ELECTRON LASER FOR SECURITY INSPECTION

Y. U. Jeong
1. Korea Atomic Energy Research Institute Yuseong, Daejeon, Korea
yujung@kaeri.re.kr
G. M. Kazakevich
1. Budker Institute of Nuclear Physics SB RAS Novosibirsk, Russian Federation
S. H. Park
1. Korea Atomic Energy Research Institute Yuseong, Daejeon, Korea
The material was received by the Editorial Board: 22.09.2010
We have designed a table-top terahertz (THz) free electron laser (FEL). The main issue of the FEL design is to decrease radiation losses at a FEL resonator except outcoupling ratio. Also reducing the number of undulator periods and total undulator length is important to increase FEL conversion efficiency and to reduce its size. The FEL consists of a magnetron-based microtron having an energy of ~5 MeV, a strong electromagnetic helical undulator having the period of ~25 mm, and a cylindrical waveguide-mode optical resonator. The total diameter of the microtron is approximately 50 cm and the macropulse current is more than 50 mA. The size of the system is expected to be 1x2 m2 . The condition for lowloss and high-gain oscillator of the table-top FEL has been studied by using a 2-D FEL code. Simple injection scheme of the electron beam to the undulator was optimized by calculating beam trajectories with a 3-D PIC code. The average THz power is calculated to be 1 W with the tunable wavelength range from 200 µm to 500 µm. The FEL is expected to be used for the real-time imaging of security inspection.

Keywords:
table-top free-electron laser, terahertz radiation, security inspection, free-electron laser.
УДК 538.9
PACS number 41.60.Cr, 42.25.Hz, 42.25.Kb

DESIGN STUDY OF A TABLE-TOP THZ FREE-ELECTRON LASER FOR SECURITY INSPECTION
References: Jeong Y. U., Kazakevich G. M., Park S. H., Lee K., Mun J., Jang K. H., Lee J. Y., Sunwoo J., Kim K. N., Lee B. C., Cha Y.-H., Cha H., Kim D. H., Cha B. H. DESIGN STUDY OF A TABLE-TOP THZ FREE-ELECTRON LASER FOR SECURITY INSPECTION . Vestnik NSU. Series: Physics. 2010, vol. 5, no. 4. P. 50–58. DOI: 10.54362/1818-7919-2010-5-4-50-58