- Siberian Journal of Physics
- Archive
- 2010
- Vol 5. No 4
- TERAHERTZ QUASI-OPTICS
MICROSTRUCTURED QUASI-OPTICAL SELECTIVE COMPONENTS FOR SUBTERAHERTZ AND TERAHERTZ APPLICATIONS
Sergei A. Kuznetsov
Scopus Author ID: 56426776500
Researcher ID: A-6723-2014
1. Novosibirsk State University Novosibirsk, Russian Federation
2. Rzhanov Institute of Semiconductor Physics of the Siberian Branch of the Russian Academy of Sciences, Novosibirsk Branch TDIAM
serge_smith@ngs.ru
Andrey V. Arzhannikov
Scopus Author ID: 7004910972
Researcher ID: C-2443-2019
1. Novosibirsk State University Novosibirsk, Russian Federation
2. Budker Institute of Nuclear Physics SB RAS Novosibirsk, Russian Federation
arzhan1@ngs.ru
Aleksandr V. Gelfand
1. Institute of Semiconductor Physics SB RAS, Novosibirsk Branch TDIAM Novosibirsk, Russian Federation
Kubarev V. V., Navarro-Cía M., Beruete M., Falcone F., Sorolla M., Thumm M.
The material was received by the Editorial Board: 28.09.2010
The development results for passive quasi-optical selective components based on planar regularly patterned metallized microstructures of subwavelength topology are described. The components include different frequency filters, polarization beam-splitters, metastructures, thin resonant absorbers, which are elaborated both for stand-alone applications and for integration with various metrological systems used in subTHz and THz measurements. The methods for electromagnetic simulation, technological implementation, and components characterization are discussed. Keywords:
terahertz instrumentation, quasi-optical components, frequency-selective surfaces, filters, metamaterials, resonant absorbers, microstructures.
УДК 537.86.029.65/.79
MICROSTRUCTURED QUASI-OPTICAL SELECTIVE COMPONENTS FOR SUBTERAHERTZ AND TERAHERTZ APPLICATIONS
References: Kuznetsov S. A., Arzhannikov A. V., Gelfand A. V., Kubarev V. V., Navarro-Cía M., Beruete M., Falcone F., Sorolla M., Thumm M. MICROSTRUCTURED QUASI-OPTICAL SELECTIVE COMPONENTS FOR SUBTERAHERTZ AND TERAHERTZ APPLICATIONS . Vestnik NSU. Series: Physics. 2010, vol. 5, no. 4. P. 79–90. DOI: 10.54362/1818-7919-2010-5-4-79-90