TERAHERTZ COHERENT SCANNING PROBE MICROSCOPE

Valeriy N.Trukhin; Nikolay N. Zinov’ev; Aleksandr V. Andrianov

TERAHERTZ COHERENT SCANNING PROBE MICROSCOPE

Valeriy N.Trukhin

1. Ioffe Physical Technical Institute of RAS St. Petersburg, Russia

valera.truchin@mail.ioffe.ru

Nikolay N. Zinov’ev

1. Ioffe Physical Technical Institute of RAS St. Petersburg, Russia

Aleksandr V. Andrianov

1. Ioffe Physical Technical Institute of RAS St. Petersburg, Russia

Samoilov L. L., Golubok A. O., Felshtyn M. L., Sapozhnikov I. D., Bykov V. A., Trukhin A. V.

The material was received by the Editorial Board: 08.09.2010

We present the terahertz (THz) scanning probe microscope which combines a THz coherent spectrometer and a scanning probe microscope. It detects forward-scattered radiation and employs harmonic signal demodulation to extract the signal of near-field contribution to scattering of THz electromagnetic waves.

Keywords:
Terahertz, near-field, microscopy, scanning probe microscope.
УДК 535-14

TERAHERTZ COHERENT SCANNING PROBE MICROSCOPE

References: Trukhin V. N., Zinov’ev N. N., Andrianov A. V., Samoilov L. L., Golubok A. O., Felshtyn M. L., Sapozhnikov I. D., Bykov V. A., Trukhin A. V. TERAHERTZ COHERENT SCANNING PROBE MICROSCOPE. Vestnik NSU. Series: Physics. 2010, vol. 5, no. 4. P. 151–153. DOI: 10.54362/1818-7919-2010-5-4-151-153