TERAHERTZ DISPERSIVE SPECTROSCOPY FOR THIN-FILM STUDY VIA SURFACE-PLASMON − BULK WAVE INTERFERENCE

A new technique for terahertz (THz) dispersive spectroscopy of thin films employing surface plasmons (SP) has been developed. The technique is based on the SP’s complex refractive index κ strong dependence on the transition layer optical constants and employs interference in parallel beams of bulk and surface waves. It is remarkable for its accuracy and enables investigators to determine both parts of κ in one measuring procedure. Devices implementing the method may be whether of static or dynamic character; the latter requires measuring time equal at least to one pulse duration.

Keywords:
surface plasmons, terahertz radiation, far infrared, dispersive spectroscopy, thin films, interference, freeelectron laser.
УДК 535.15/535.321

TERAHERTZ DISPERSIVE SPECTROSCOPY FOR THIN-FILM STUDY VIA SURFACE-PLASMON − BULK WAVE INTERFERENCE