6. Solid-State and Semiconductor Physics, Physics of Nanostructures

DEVELOPMENT OF DEBYE – SCHERRER METHOD FOR STUDY OF POLYCRYSTALLINE SAMPLES

Anton V. Panchenko
1. Nikolaev Institute of Inorganic Chemistry SB RAS Novosibirsk, Russian Federation
2. Novosibirsk State University Novosibirsk, Russian Federation
anton.physnsu@gmail.com
Alexey V. Alekseev
1. Nikolaev Institute of Inorganic Chemistry SB RAS Novosibirsk, Russian Federation
2. Novosibirsk State University Novosibirsk, Russian Federation
Sergey A. Gromilov
1. Nikolaev Institute of Inorganic Chemistry SB RAS Novosibirsk, Russian Federation
2. Novosibirsk State University Novosibirsk, Russian Federation
grom@niic.nsc.ru
The material was received by the Editorial Board: 04.08.2011
A quick test has been proposed for the refinement of the unit cell parameters of polycrystalline samples including massive those with a large absorption coefficient. The Debye – Scherrer scheme used as the basis was realized on a Bruker X8APEX diffractometer (MoKα radiation, the plate two-coordinate CCD detector position 2θ ± 90°, the resolution 1 024 × 1 024, accumulation time 15 min). External standards were α-Al2O3 and Au. A polished section of the Ir0,85Re0,15 metal tablet was studied. The measurement precision of the unit cell parameter, afcc = 3.8470(4) A, was confirmed by studying the sample in the Bragg-Brentano geometry.

Keywords:
Debye – Scherrer method, CCD detector, standard, precision, unit cell parameters.
УДК 548.734; 548.735.4; 548.735.6

DEVELOPMENT OF DEBYE – SCHERRER METHOD FOR STUDY OF POLYCRYSTALLINE SAMPLES
References: Panchenko A. V., Alekseev A. V., Gromilov S. A. DEVELOPMENT OF DEBYE – SCHERRER METHOD FOR STUDY OF POLYCRYSTALLINE SAMPLES. Vestnik NSU. Series: Physics. 2012, vol. 7, no. 2. P. 93–97 (in Russ.). DOI: 10.54362/1818-7919-2012-7-2-93-97