IMPROVING OF ACCURACY OF MEASUREMENTS OF UNIT CELL PARAMETERS BY DIFFRACTION REFLECTIONS AT SMALL ANGLES

The main purpose of the work is the improving of accuracy of the unit cell parameters the measurements by diffraction data at small angles. The basis of this approach is creating of new laboratory standard, which is the mixture of the etalon silicon SRM-640 and chelate compound of the copper (II) 4-phenatsetiliden-2,2,5,5-tetramethyl-3-imidazoline-1- oxyl (CuL₂). The feature of the preparing of this standard is a crystallizing of CuL₂ directly on a sample holder. That causes almost ideal orienting of the needle tetragonal crystals on a cuvette and there are diffraction reflections on the diffractogram only of hk0 type. Their depositions allow to make a calibration of the goniometer starting with 4° 2θ.

Keywords:
x-ray diffraction of polycrystallines, standard, small angles of diffraction, accuracy. 
УДК 548.737

IMPROVING OF ACCURACY OF MEASUREMENTS OF UNIT CELL PARAMETERS BY DIFFRACTION REFLECTIONS AT SMALL ANGLES