REFLECTIVITY KINETICS OF THE FAST SEMICONDUCTOR MIRROR

Gennady M. Borisov
1. Rzhanov Institute of Semiconductor Physics SB RAS Novosibirsk, Russian Federation
2. Novosibirsk State University Novosibirsk, Russian Federation
gennadiy.m.borisov@gmail.com
Veniamin G. Gol’dort
1. Rzhanov Institute of Semiconductor Physics SB RAS Novosibirsk, Russian Federation
goldort@academ.org
Alexander A. Kovalyov
1. Rzhanov Institute of Semiconductor Physics SB RAS Novosibirsk, Russian Federation
2. Novosibirsk State University Novosibirsk, Russian Federation
kovalev@isp.nsc.ru
The material was received by the Editorial Board: 25.06.2017
The shape of kinetic curves for reflectivity of the fast semiconductor A3B5 mirror with saturable absorption is investigated by single-frequency pump-probe technique centered at 1 035 nm with the pulse duration of 130 fs and the repetition rate of 70 MHz in the exciting radiation intensities region of 0.16–5.44 GW/cm2 . Modeling and comparison with the experiment is accomplished. It is shown that the signal increase is determined by the femtosecond radiation pulse front and by the excitons lifetime; the short peak at the beginning of the curve reflects the process of excitons ionization. The charge free carriers contribution appears after quasi-equilibrium installation time of about 1 ps, and it disappears with the characteristic electron-hole recombination time of about 10 ps, which controls the mirror’s performance.

Keywords:
quantum wells, fast semiconductor A3B5 mirrors with absorption saturation, passive mode-locking of lasers.
УДК 535:621.373.826:539

REFLECTIVITY KINETICS OF THE FAST SEMICONDUCTOR MIRROR
References: Borisov G. M., Fol’dort V. G., Kovalyov A. A., Ledovskikh D. V., Rubtsova N. N. REFLECTIVITY KINETICS OF THE FAST SEMICONDUCTOR MIRROR. Siberian Journal of Physics . 2017, vol. 12, no. 3. P. 107–113. (in Russ.). DOI: 10.25205/2541-9447-2017-12-3-107-113