MULTISLIT FOUR-ELECTRODE ION-OPTICAL SYSTEM FOR FAST ATOMICAL DIAGNOSTIC BEAM FORMATION

Aleksandr A. Listopad
1. Budker Institute of Nuclear Physics SB RAS Novosibirsk, Russian Federation
alexlist@yandex.ru
Vladimir I. Davydenko
1. Budker Institute of Nuclear Physics SB RAS Novosibirsk, Russian Federation
Aleksandr A. Ivanov
1. Budker Institute of Nuclear Physics SB RAS Novosibirsk, Russian Federation
2. Novosibirsk State University Novosibirsk, Russian Federation
A.A.Ivanov@inp.nsk.su
The material was received by the Editorial Board: 02.04.2012
For the formation of a narrow atomic diagnostic beam the providing of small angular divergence is fundamentally important issue. When using a slit geometry angular divergence of the beam in the direction along the slit is mainly determined by ion temperature in the plasma source. As a result of the applying the multislit ion optics to the injector RUDI the total beam current (in ions) is increased from 2 to 3 A, the angular divergence of the beam in the direction along the slit is reduced to 0.35º.

Keywords:
plasma diagnostics, neutral beams, slit ion optics, geometrical focusing. 
УДК 621

MULTISLIT FOUR-ELECTRODE ION-OPTICAL SYSTEM FOR FAST ATOMICAL DIAGNOSTIC BEAM FORMATION
References: Listopad A. A., Davydenko V. I., Ivanov A. A., Mishagin V. V., Uhlemann R., Schweer B. MULTISLIT FOUR-ELECTRODE ION-OPTICAL SYSTEM FOR FAST ATOMICAL DIAGNOSTIC BEAM FORMATION. Vestnik NSU. Series: Physics. 2012, vol. 7, no. 2. P. 15–24 (in Russ.). DOI: 10.54362/1818-7919-2012-7-2-15-24