COMPUTATIONAL PROCEDURE FOR RESONANT FREQUENCY OF A MULTI-LAYER DIELECTRIC STRUCTURE ON THE BASIS OF CIRCUIT ANALYSIS

Sergey V. Savelkaev
1. Siberian State University Geosystems and Technology Novosibirsk, Russian Federation
kaf.suit@ssga.ru
Valerik S. Airapetyan
1. Siberian State University Geosystems and Technology Novosibirsk, Russian Federation
v.s.ayrapetyan@ssga.ru
The material was received by the Editorial Board: 29.01.2014
This paper introduces a computational procedure to define the resonant frequency of a multi-layer dielectric structure on the basis of circuit analysis which allows for a simplest determination of its characteristic equation system vs. electrodynamic methods.

Keywords:
multi-layer dielectric structure, resonant frequency, characteristic equation system.
УДК 621.372.413

COMPUTATIONAL PROCEDURE FOR RESONANT FREQUENCY OF A MULTI-LAYER DIELECTRIC STRUCTURE ON THE BASIS OF CIRCUIT ANALYSIS
References: Savelkaev S. V., Ayrapetyan V. S. COMPUTATIONAL PROCEDURE FOR RESONANT FREQUENCY OF A MULTI-LAYER DIELECTRIC STRUCTURE ON THE BASIS OF CIRCUIT ANALYSIS. Vestnik NSU. Series: Physics. 2014, vol. 9, no. 1. P. 6–9 (in Russ.). DOI: 10.54362/1818-7919-2014-9-1-6-9